The state-of–the-art 5MV Pelletron Tandem Accelerator Facility [Technical specifications: Beam Energy: 0.8MeV to 25 MeV; Charging System: Pelletron Charging; Ion Current:1 nA -200nA; Ions (available): H, He, C, Si, Cu, Ni and Au; and Two Beam Ports (15˚ & 30˚)] at NCP Complex offers its professional expertise to the researchers and industry in Pakistan in the following analytical techniques:
- Particle induced X-ray emission (PIXE) analysis
- Rutherford (and Non-Rutherford) Back Scattering (RBS) analysis
- Elastic recoil detection analysis (ERDA)
- Gamma Ray Spectroscopy (GRS)
- Ion-Beam modification of materials
These ion beam analysis techniques are being used for:
- Non- destructive compositional analysis
- Quantitative elemental analysis
- Crystallographic analysis of multilayer thin films
- Lattice studies for dopant location & defect depth profiling
- Trace analysis for environmental, industrial and biological fields
