The state-of–the-art 5MV Pelletron Tandem Accelerator Facility [Technical specifications: Beam Energy: 0.8MeV to 25 MeV; Charging System: Pelletron Charging; Ion Current:1 nA -200nA; Ions (available): H, He, C, Si, Cu, Ni and Au; and Two Beam Ports (15˚ & 30˚)] at NCP Complex offers its professional expertise to the researchers and industry in Pakistan in the following analytical techniques:

  • Particle induced X-ray emission (PIXE) analysis
  • Rutherford (and Non-Rutherford) Back Scattering (RBS) analysis
  • Elastic recoil detection analysis (ERDA)
  • Gamma Ray Spectroscopy (GRS)
  • Ion-Beam modification of materials

These ion beam analysis techniques are being used for:

  • Non- destructive compositional analysis
  • Quantitative elemental analysis
  • Crystallographic analysis of multilayer thin films
  • Lattice studies for dopant location & defect depth profiling
  • Trace analysis for environmental, industrial and biological fields

Dr. Mohsin Siddiq
Acting Director
Phone: +92 (51) 207 7351